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Contents |
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Current Projects |
- DfT for Electrical Tests of 3D Stacked ICs
- DfT for Electrical Tests of CMOS Image Sensors
- Electrical Test and Yield Improvement in 3D Stacked Memory ICs
- High Speed IDDX Test and Its Current Sensor Design
- Supply Current Test of Open Defects in CMOS Logic ICs
- Testing of Opens and Shorts in Printed Circuit Boards
- IDDQ Testable Design of Mixed Signal ICs
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Research Interests |
- Design and Test of Analog and Digital Circuits
- Design for Testability
- Open and Short Tests in ICs and Printed Circuit Boards
- IDDx Tests
- Electrical Tests of Mixed Signal ICs
- 3D IC Test
- Memory Test
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Keywords |
- Design and Test(D&T)
- Design for Testability(DfT)
- Supply Current Testing(IDDx Testing)
- Image Sensor
- Analog Circuit
- Microcomputer
- Memory IC
- 3D IC
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E-mail |
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Links |
Japanease Page
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Dept. of Electrical and Electronic Engineering
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Faculty of Engineering
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Tokushima University
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